Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis

Conference Object

Abstract: This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when they

Palabras claves:

accelerated tests, Am-Be source, power MOSFETs, reliability, SEB, SEE, SEGR, Terrestrial neutrons

Autores:

Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Marchese N., Mazzeo M., Pace C., Parlato A., Privitera G., Tomarchio E.

Fuentes:

google

scopus