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Assessment of InAs/AlGaSb Tunnel-FET Virtual Technology Platform for Low-Power Digital Circuits
ArticleAbstract: In this work, a complementary InAs/Al0.05Ga0.95Sb tunnel field-effect-Transistor (TFET) virtual techPalabras claves:full-Adder, III-V, tunnel field effect transistor (TFET), very large scale integration (VLSI).Autores:Crupi F., Esseni D., Marco Lanuzza, Palestri P., Selmi L., Strangio S.Fuentes:scopusA Compact Model with Spin-Polarization Asymmetry for Nanoscaled Perpendicular MTJs
ArticleAbstract: The aim of this paper is to introduce a compact model for perpendicular spin-transfer torque (STT)-mPalabras claves:compact model, Magnetic tunnel junction (MTJ), spin-transfer torque (STT), STT-magnetic random access memory (MRAM), technology scalingAutores:Carangelo G., Carpentieri M., Crupi F., D'Aquino M., Finocchio G., Marco Lanuzza, Rose R.D.Fuentes:scopusInfluence of GaN- and Si <inf>3</inf> N <inf>4</inf> -Passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination
ArticleAbstract: This paper analyses the influence of the GaN and Si 3 N 4 passivation (or 'cap') layer on the top ofPalabras claves:activation energy, AlGaN/GaN Schottky diode, breakdown voltage, GaN cap, off-state, passivation layer, reliability, Si N cap 3 4Autores:Bakeroot B., Crupi F., De Jaeger B., Decoutere S., Eliana Acurio, Ronchi N., Trojman L.Fuentes:googlescopusMixed Tunnel-FET/MOSFET Level Shifters: A New Proposal to Extend the Tunnel-FET Application Domain
ArticleAbstract: In this paper, we identify the level shifter (LS) for voltage up-conversion from the ultralow-voltagPalabras claves:Level shifter (LS), technology computer-Aided design (TCAD), tunnel FET (TFET).Autores:Crupi F., Esseni D., Marco Lanuzza, Palestri P., Strangio S.Fuentes:scopusUnderstanding the potential and limitations of tunnel FETs for low-voltage analog/mixed-signal circuits
ArticleAbstract: In this paper, the analog/mixed-signal performance is evaluated at device and circuit levels for a IPalabras claves:Analog circuits, Analog figures of merit, Comparators, Track and hold (T/H), tunnel FET (TFET)Autores:Crupi F., Esseni D., Marco Lanuzza, Palestri P., Selmi L., Settino F., Strangio S.Fuentes:scopusReliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination
ArticleAbstract: This paper focuses on the time-dependent breakdown of the AlGaN/GaN Schottky barrier diodes with a gPalabras claves:AlGaN/GaN Schottky diode, gated edge termination (GET), hard breakdown, intrinsic failures, off-state, reliability, Weibull distributionAutores:Bakeroot B., Crupi F., De Jaeger B., Decoutere S., Eliana Acurio, Ronchi N., Trojman L.Fuentes:googlescopus