Mostrando 3 resultados de: 3
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Publisher
IEEE Transactions on Nuclear Science(2)
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(1)
Área temáticas
Física aplicada(3)
Origen
scopus(3)
Grenoble large scale facilities for advanced characterisation of microelectronics devices
Conference ObjectAbstract: The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world uniquPalabras claves:Devices characterisation, Failure analysis, Neutron irradiation, reliability, Thermal neutrons, TomographyAutores:Baylac M., Beaucour J., Capria E., Curfs C., Francesca Villa, Giroud B., Mitchell E., Rey S., Royer J.C., Segura-Ruiz J.Fuentes:scopusEvidence of the robustness of a cots soft-error free SRAM to Neutron Radiation
ArticleAbstract: Radiation tests with 15-MeV neutrons were performed in a COTS SRAM including a new memory cell desigPalabras claves:Cots, LPSRAM, MUSCA SEP3, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mansour W., Palomar C., Rey S., Rosetto O., Velazco R.Fuentes:scopusSEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2-MeV Neutrons
ArticleAbstract: This paper presents a single event upset (SEU) sensitivity characterization at ultralow bias voltagePalabras claves:Commercial off-the-shelf (COTS), low bias voltage, neutron tests, radiation hardness, reliability, Soft error, static random access memories (SRAM)Autores:Baylac M., Clemente J.A., Fraire J., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopus