Mostrando 2 resultados de: 2
Filtros aplicados
Subtipo de publicación
Conference Object(2)
Área temáticas
Electricidad y electrónica(1)
Área de conocimiento
Ingeniería electrónica(2)
Ciencia de materiales(1)
Física de partículas(1)
Semiconductor(1)
Año de Publicación
2013(2)
Dangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis
Conference ObjectAbstract: This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when theyPalabras claves:accelerated tests, Am-Be source, power MOSFETs, reliability, SEB, SEE, SEGR, Terrestrial neutronsAutores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Marchese N., Mazzeo M., Pace C., Parlato A., Privitera G., Tomarchio E.Fuentes:googlescopusInnovative instrumentation for HTRB tests on semiconductor power devices
Conference ObjectAbstract: An automated system designed to perform reliability tests on power transistors is reported. An innovPalabras claves:Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal controlAutores:Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.Fuentes:googlescopus