Grenoble large scale facilities for advanced characterisation of microelectronics devices

Conference Object

Abstract: The French IRT-Nanoelec consortium in collaboration with GENEPI2 accelerator is offering world uniqu

Palabras claves:

Devices characterisation, Failure analysis, Neutron irradiation, reliability, Thermal neutrons, Tomography

Autores:

Baylac M., Beaucour J., Capria E., Curfs C., Francesca Villa, Giroud B., Mitchell E., Rey S., Royer J.C., Segura-Ruiz J.

Fuentes:

scopus