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AEIT Annual Conference 2013: Innovation and Scientific and Technical Culture for Development, AEIT 2013 - Selected Proceedings Papers(2)
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC(1)
Lecture Notes in Electrical Engineering(1)
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A novel instrumentation for an advanced high temperature reverse bias (HTRB) testing on power transistors
ArticleAbstract: In this paper, a novel instrumentation for High Temperature Reverse Bias (HTRB) reliability test onPalabras claves:Autores:Giordano C., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusDangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis
Conference ObjectAbstract: This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when theyPalabras claves:accelerated tests, Am-Be source, power MOSFETs, reliability, SEB, SEE, SEGR, Terrestrial neutronsAutores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Marchese N., Mazzeo M., Pace C., Parlato A., Privitera G., Tomarchio E.Fuentes:googlescopusEffects on power transistors of Terrestrial Cosmic Rays: Study, experimental results and analysis
Conference ObjectAbstract: High voltage power transistors used in inverters for photovoltaic panels and avionic applications arPalabras claves:Autores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Mazzeo M., Pace C., Privitera G.Fuentes:googlescopusInnovative instrumentation for HTRB tests on semiconductor power devices
Conference ObjectAbstract: An automated system designed to perform reliability tests on power transistors is reported. An innovPalabras claves:Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal controlAutores:Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.Fuentes:googlescopus