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InN thin film lattice dynamics by grazing incidence inelastic X-ray scattering

Abstract:

Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides. © 2011 American Physical Society.

Año de publicación:

2011

Keywords:

    Fuente:

    scopusscopus

    Tipo de documento:

    Article

    Estado:

    Acceso restringido

    Áreas de conocimiento:

    • Ciencia de materiales
    • Ciencia de materiales

    Áreas temáticas:

    • Física

    Contribuidores:

    Wang X.Wang X.
    Romero A.H.Romero A.H.
    Bosak A.Bosak A.
    Kuball M.Kuball M.
    Jorge SerranoJorge Serrano
    Garro N.Garro N.
    Yoshikawa A.Yoshikawa A.
    Manjón F.J.Manjón F.J.
    Krisch M.Krisch M.