Mostrando 3 resultados de: 3
Filtros aplicados
Publisher
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(2)
IEEE Transactions on Nuclear Science(1)
Área temáticas
Física aplicada(3)
Ciencias de la computación(2)
Comunicaciones(1)
Instrumentos de precisión y otros dispositivos(1)
Programación informática, programas, datos, seguridad(1)
Área de conocimiento
Ciencias de la computación(2)
Arquitectura de computadoras(1)
Ingeniería electrónica(1)
Simulación por computadora(1)
Origen
scopus(3)
Evaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage
Conference ObjectAbstract: This paper presents an experimental study of the sensitivity to 14-MeV neutrons to low bias voltagePalabras claves:Cots, low-bias voltage, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Velazco R.Fuentes:scopusSome properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs
Conference ObjectAbstract: Statistical properties of experiments in SRAMs with only SBUs are mathematically evaluated. StrategiPalabras claves:Multiple cell upsets, single bit upsets, single events, soft errors, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopusStatistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs
ArticleAbstract: Recently, the occurrence of multiple events in static tests has been investigated by checking the stPalabras claves:Multiple cell upsets, neutron tests, Single Event Upsets, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopus