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AEIT Annual Conference 2013: Innovation and Scientific and Technical Culture for Development, AEIT 2013 - Selected Proceedings Papers(2)
2016 IEEE Ecuador Technical Chapters Meeting, ETCM 2016(1)
Applied Surface Science(1)
Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC(1)
IEEE Global Engineering Education Conference, EDUCON(1)
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google(8)
Classic Controllers Design Applied to Temperature Control for a Plastic Thermoforming Machine
Conference ObjectAbstract: The present document describes the methodology used for the design and implementation of a temperatuPalabras claves:AC/AC Converter, anti-windup, PI Controller, Temperature control, ThermoformingAutores:F. Cabrera-Aguayo, Jesús Rodríguez-Flores, Jorge Hernandez-Ambato, José Cortés-LlanganateFuentes:scopusAugmented reality implementation as reinforcement tool for public textbooks education in Ecuador
Conference ObjectAbstract: The present work releases on the methodology followed for the implementation and experimentation ofPalabras claves:Active Education, Augmented reality, Mobile application, Public education, Reinforcement ToolAutores:A. Lluma-Noboa, D. Paredes-Velastegui, Diana Elizabeth Olmedo-Vizueta, Diana Olmedo Vizueta, Diego Fernando Avila-Pesantez, Jorge Hernandez-AmbatoFuentes:googlescopusA New Effective Methodology for Semiconductor Power Devices HTRB Testing
ArticleAbstract: An advanced high-temperature reverse bias (HTRB) testing procedure for performing reliability testsPalabras claves:High-temperature reverse bias (HTRB), instrumentation, Power devices, reliability, thermal runawayAutores:Consentino G., D'Ignoti A., Fragomeni L., Galiano S., Grimaldi A., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusA novel instrumentation for an advanced high temperature reverse bias (HTRB) testing on power transistors
ArticleAbstract: In this paper, a novel instrumentation for High Temperature Reverse Bias (HTRB) reliability test onPalabras claves:Autores:Giordano C., Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusDangerous effects induced on power MOSFETs by terrestrial neutrons: A theoretical study and an empirical approach based on accelerated experimental analysis
Conference ObjectAbstract: This paper investigates the effects that terrestrial neutrons can induce on power MOSFETs when theyPalabras claves:accelerated tests, Am-Be source, power MOSFETs, reliability, SEB, SEE, SEGR, Terrestrial neutronsAutores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Marchese N., Mazzeo M., Pace C., Parlato A., Privitera G., Tomarchio E.Fuentes:googlescopusEmbedded mini-Heater design for power loss remote measurement and thermal runaway control on power devices for Accelerated Life Testing
Conference ObjectAbstract: This paper points out to the use of a COTS SAFeFET in the design of an Embedded mini-Heater (EmH) adPalabras claves:ALTs, Embedded mini-Heater, Power Dissipation Measurement, SAFeFET, Temperature control, thermal runawayAutores:Jorge Hernandez-Ambato, Pace C.Fuentes:googlescopusEffects on power transistors of Terrestrial Cosmic Rays: Study, experimental results and analysis
Conference ObjectAbstract: High voltage power transistors used in inverters for photovoltaic panels and avionic applications arPalabras claves:Autores:Consentino G., Giordano C., Jorge Hernandez-Ambato, Laudani M., Mazzeo M., Pace C., Privitera G.Fuentes:googlescopusMultistep-ahead streamflow and reservoir level pbkp_rediction using ANNs for production planning in hydroelectric stations
Conference ObjectAbstract: In this work, a methodology to estimate the reservoir level in a hydroelectric dam, based on the pbkPalabras claves:ANNs, Hydroelectric, pbkp_rediction, Reservoir Level, streamflowAutores:Alberto Alonso Arellano, Cunalata C., Gabriel Asqui-Santillan, Jorge Hernandez-AmbatoFuentes:scopusNeural Adaptive Controller Applied to a VTOL Plant Using Takagi-Sugeno Fuzzy Model
Conference ObjectAbstract: In this paper, a comparison of the regularity actions between a conventional PID controller and a nePalabras claves:Classic control, Fuzzy Inference, Intelligent Control, Membership Functions, Vertical FlightAutores:Andrés Morocho-Caiza, Jesús Rodríguez-Flores, Jorge Hernandez-AmbatoFuentes:scopusInnovative instrumentation for HTRB tests on semiconductor power devices
Conference ObjectAbstract: An automated system designed to perform reliability tests on power transistors is reported. An innovPalabras claves:Cycles stress, HTRB, Mini-heater, Power devices, reliability, Thermal controlAutores:Consentino G., D'Ignoti A., De Pasquale D., Galiano S., Giordano C., Jorge Hernandez-Ambato, Mazzeo M., Pace C.Fuentes:googlescopus