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Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devices
OtherAbstract: Accelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was cPalabras claves:Autores:Verónica Alexandra Melo LópezFuentes:googleReliability issues in GaAs-based devices for space applications
OtherAbstract: This work describes some of the effects of high humidity and temperature tests undertaken with the 2Palabras claves:Autores:Verónica Alexandra Melo LópezFuentes:google