Mostrando 3 resultados de: 3
Subtipo de publicación
Conference Object(3)
Publisher
IEEE MTT-S International Microwave Symposium Digest(2)
Proceedings of the 1st European Microwave Integrated Circuits Conference, EuMIC 2006(1)
Área temáticas
Física aplicada(3)
Área de conocimiento
Ingeniería electrónica(3)
Fabricación de dispositivos semiconductores(1)
Semiconductor(1)
Origen
scopus(3)
New drain current model for MESFET/HEMT devices based on pulsed measurements
Conference ObjectAbstract: In this work, a new ids current equation and FET model are proposed based on DC and pulsed I/V measuPalabras claves:Circuit modeling, FET circuits, MESFETs, Microwave devices, pulsed measurements, Scattering parameter measurementAutores:Brady R., Brazil T.J., Guillermo Rafael-ValdiviaFuentes:scopusLarge-signal FET modeling based on pulsed measurements
Conference ObjectAbstract: The new FET model presented in this paper highlights a method through which complex current flow dynPalabras claves:FETs, Intermodulation distortion, MESFETs, Nonlinear circuits, Power amplifiers, Scattering parametersAutores:Brady R., Brazil T.J., Guillermo Rafael-ValdiviaFuentes:scopusSingle function drain current model for MESFET/HEMT devices including pulsed dynamic behavior
Conference ObjectAbstract: A new approach to modeling the dynamic behavior of microwave devices based on pulsed measurements, iPalabras claves:Circuit modeling, FETs, Microwave devices, pulsed measurements, Scattering parametersAutores:Brady R., Brazil T.J., Guillermo Rafael-ValdiviaFuentes:scopus