Mostrando 2 resultados de: 2
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Conference Object(2)
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IEEE MTT-S International Microwave Symposium Digest(1)
Proceedings of the 1st European Microwave Integrated Circuits Conference, EuMIC 2006(1)
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scopus(2)
New drain current model for MESFET/HEMT devices based on pulsed measurements
Conference ObjectAbstract: In this work, a new ids current equation and FET model are proposed based on DC and pulsed I/V measuPalabras claves:Circuit modeling, FET circuits, MESFETs, Microwave devices, pulsed measurements, Scattering parameter measurementAutores:Brady R., Brazil T.J., Guillermo Rafael-ValdiviaFuentes:scopusSingle function drain current model for MESFET/HEMT devices including pulsed dynamic behavior
Conference ObjectAbstract: A new approach to modeling the dynamic behavior of microwave devices based on pulsed measurements, iPalabras claves:Circuit modeling, FETs, Microwave devices, pulsed measurements, Scattering parametersAutores:Brady R., Brazil T.J., Guillermo Rafael-ValdiviaFuentes:scopus