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2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017(2)
2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018(1)
2019 IEEE 10th Latin American Symposium on Circuits and Systems, LASCAS 2019 - Proceedings(1)
2019 IEEE 4th Ecuador Technical Chapters Meeting, ETCM 2019(1)
2020 IEEE ANDESCON, ANDESCON 2020(1)
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720p-HD Gray-scale and Color Images Shape Recognition System Implementation on an FPGA Platform with a 1080pFull-HD HDMI Interface using a Hu Moments Algorithm
Conference ObjectAbstract: The present work implements and adapts a fast shape recognition algorithm on the Xilinx VC707 VIRTEXPalabras claves:ADV7511, Fpga, Full-HD, Gray Scale, HDL, HDMI, IIC, RGB, Shape recognitionAutores:André Borja, Daniel Cárdenas, Felipe Toscano, Luis Miguel Procel Moya, Ramiro Taco, Trojman L.Fuentes:scopusA 180 nm Low-Cost Operational Amplifier for IoT Applications
Conference ObjectAbstract: This paper presents the design and post-layout simulation of a two-stage operational amplifier (opamPalabras claves:0.18 μ m, cadence virtuoso, High-performance, internet of things (IoT), Low-cost, miller compensation, operational amplifier, post-layout simulation, stabilityAutores:Ariana Musello, Cristhopher Mosquera, Kevin Vicuña, Luis Miguel Procel Moya, Marco Lanuzza, Mateo Rendón, Ramiro Taco, Trojman L.Fuentes:scopusA Defect-Centric Analysis of the Temperature Dependence of the Channel Hot Carrier Degradation in nMOSFETs
ArticleAbstract: The defect-centric distribution is used to study the temperature dependence of channel hot carrier (Palabras claves:channel hot carrier degradation, defect-centric distribution, temperature analysisAutores:Crupi F., Franco J., Kaczer B., Luis Miguel Procel Moya, Trojman L.Fuentes:googlescopusBinarization Methodology Applied to Digital Images of Petroglyphs from Cueva del Diablo of Manabí
Conference ObjectAbstract: In the present work, we developed and implemented a binarization technique for petroglyph images. ThPalabras claves:anisotropic diffusion, binarization algorithm, contrast enhancement, edge detection, IMAGE PROCESSING, petroglyphs, Pictograms, rock artAutores:Andres Jerez, Florencio Delgado, Josefina Vasquez, Luis Miguel Procel Moya, Michelle Aviles, Trojman L.Fuentes:scopusBreast cancer, screening and diagnostic tools: All you need to know
ReviewAbstract: Breast cancer is one of the most frequent malignancies among women worldwide. Methods for screeningPalabras claves:Artificial Intelligence, biopsy, Breast Cancer, diagnosis, Genetic profiling, Mammography, screening, toolsAutores:Andrés Caicedo, Ariana León-Sosa, D. A. Barba Carrera, Daniela Suquillo, Fernando Torres, Lugo P., Surre F., Trojman L.Fuentes:scopusCapacitance Extraction of 34-nm Metallurgical Channel Length MOSFET for Parasitic Assessment Using the RFCV Technique
Conference ObjectAbstract: This paper presents the description and the results obtained with a new RFCV system written on pythoPalabras claves:Parameter Analyzer, PYTHON, RFCV, Source Measure Unit, Vector Network AnalyzerAutores:DIego R. Benalcázar, Esteban Garzón, Trojman L.Fuentes:scopusImplementation and optimization of the algorithm of automatic color enhancement in digital images
Conference ObjectAbstract: This paper studies the implementation of an algorithm to enhance the color of an image by considerinPalabras claves:Autores:Juan Sebastian Romero, Luis Miguel Procel Moya, Trojman L., Verdier D.Fuentes:googlescopusRemote control of VNA and parameter analyzer for RFCV measurements using Python
Conference ObjectAbstract: This paper presents the development of capacitance measurement with RF signal (RFCV) for MOSFET. SucPalabras claves:IEEE 488.2, MOSFET, Network Analyzer, PYTHON, RFCV, SCPI, SMU, VNAAutores:Esteban Garzón, Fernando Sanchez, Luis Miguel Procel Moya, Trojman L.Fuentes:scopusMicroprocessor Design with a Direct Bluetooth Connection in 45 nm Technology Using Microwind
Conference ObjectAbstract: This paper presents the full-custom design of a 45 nm microprocessor using the electronic design autPalabras claves:45nm, Arithmetic Logic Unit (ALU), Bluetooth (BT), MEMORY, Microprocessor, Microwind, PVT, Radio frequency (RF)Autores:Carlos Macias, Diego Jaramillo, Eliana Acurio, Esteban Garzón, Felix Chavez, Luis Miguel Procel Moya, Sánchez Luis, Sicard E., Sofia Lara, Trojman L.Fuentes:googlescopusMobility extraction for 24-nm-channel length n-MOS using the RFCV technique: Effect of the fabrication process
Conference ObjectAbstract: In this article, we study the mobility for short devices (down to 24-nm-channel length) using the RFPalabras claves:additional mobility, Halo, n-MOS, RFCV, short channel device, SION, Y-functionAutores:DIego R. Benalcázar, Jobard G., Luis Miguel Procel Moya, Trojman L.Fuentes:googlescopus