Mostrando 6 resultados de: 6
Filtros aplicados
Publisher
IEEE Transactions on Nuclear Science(3)
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS(2)
LATS 2016 - 17th IEEE Latin-American Test Symposium(1)
Área temáticas
Física aplicada(6)
Ciencias de la computación(4)
Programación informática, programas, datos, seguridad(2)
Ciencias sociales(1)
Comunicaciones(1)
A deep analysis of SEU consequences in the internal memory of LEON3 processor
Conference ObjectAbstract: This paper presents an analysis of the effects of Single Event Upset (SEU) into the internal memoryPalabras claves:Autores:Bouesse F., Hadj W.E., Kchaou A., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, Tourki R., Velazco R.Fuentes:googlescopusEvaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons
ArticleAbstract: The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implementedPalabras claves:Accelerated testing, AMP, Multi-core, SEE, SEFI, SEU, SMP, Soft error, SOIAutores:Baylac M., Clemente J.A., Francesca Villa, Mehaut J.F., Pablo F. Ramos, Rey S., Vanessa Vargas, Velazco R., Zergainoh N.E.Fuentes:scopusEvaluation of the sensitivity of a COTS 90-nm SRAM memory at low bias voltage
Conference ObjectAbstract: This paper presents an experimental study of the sensitivity to 14-MeV neutrons to low bias voltagePalabras claves:Cots, low-bias voltage, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Velazco R.Fuentes:scopusSingle events in a COTS soft-error free SRAM at low bias voltage induced by 15-MeV neutrons
ArticleAbstract: This paper presents an experimental study of the sensitivity to 15-MeV neutrons of Advanced Low PowePalabras claves:Cots, LPSRAM, neutron tests, radiation hardness, reliability, Soft error, SRAMAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Mecha H., Pablo F. Ramos, PABLO FRANCISCO RAMOS VARGAS, VANESSA CAROLINA VARGAS VALLEJO, Vanessa Vargas, Velazco R.Fuentes:googlescopusSome properties of only-SBUs scenarios in SRAMs applied to the detection of MCUs
Conference ObjectAbstract: Statistical properties of experiments in SRAMs with only SBUs are mathematically evaluated. StrategiPalabras claves:Multiple cell upsets, single bit upsets, single events, soft errors, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopusStatistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs
ArticleAbstract: Recently, the occurrence of multiple events in static tests has been investigated by checking the stPalabras claves:Multiple cell upsets, neutron tests, Single Event Upsets, SRAMsAutores:Agapito J.A., Baylac M., Clemente J.A., Francesca Villa, Franco F.J., Hubert G., Mecha H., Puchner H., Rey S., Velazco R.Fuentes:scopus