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2018 IEEE 3rd Ecuador Technical Chapters Meeting, ETCM 2018(3)
2019 IEEE 4th Ecuador Technical Chapters Meeting, ETCM 2019(3)
2017 IEEE International Autumn Meeting on Power, Electronics and Computing, ROPEC 2017(2)
ETCM 2021 - 5th Ecuador Technical Chapters Meeting(2)
IEEE International Reliability Physics Symposium Proceedings(2)
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720p-HD Gray-scale and Color Images Shape Recognition System Implementation on an FPGA Platform with a 1080pFull-HD HDMI Interface using a Hu Moments Algorithm
Conference ObjectAbstract: The present work implements and adapts a fast shape recognition algorithm on the Xilinx VC707 VIRTEXPalabras claves:ADV7511, Fpga, Full-HD, Gray Scale, HDL, HDMI, IIC, RGB, Shape recognitionAutores:André Borja, Daniel Cárdenas, Felipe Toscano, Luis Miguel Procel Moya, Ramiro Taco, Trojman L.Fuentes:scopusA 180 nm Low-Cost Operational Amplifier for IoT Applications
Conference ObjectAbstract: This paper presents the design and post-layout simulation of a two-stage operational amplifier (opamPalabras claves:0.18 μ m, cadence virtuoso, High-performance, internet of things (IoT), Low-cost, miller compensation, operational amplifier, post-layout simulation, stabilityAutores:Ariana Musello, Cristhopher Mosquera, Kevin Vicuña, Luis Miguel Procel Moya, Marco Lanuzza, Mateo Rendón, Ramiro Taco, Trojman L.Fuentes:scopusA Defect-Centric Analysis of the Temperature Dependence of the Channel Hot Carrier Degradation in nMOSFETs
ArticleAbstract: The defect-centric distribution is used to study the temperature dependence of channel hot carrier (Palabras claves:channel hot carrier degradation, defect-centric distribution, temperature analysisAutores:Crupi F., Franco J., Kaczer B., Luis Miguel Procel Moya, Trojman L.Fuentes:googlescopusA Defect-Centric perspective on channel hot carrier variability in nMOSFETs
ArticleAbstract: In this work we confirm the validity of the Defect-Centric distribution for predicting the CHC behavPalabras claves:channel hot carrier degradation, defect-centric distribution, variabilityAutores:Crupi F., Franco J., Kaczer B., Luis Miguel Procel Moya, Trojman L., Tuinhout H., Wils N.Fuentes:googlescopusA phenomenological model of the resistive switching for Hf-based ReRAM devices
Conference ObjectAbstract: This paper presents the current-voltage (I-V) characteristics of HfO 2 -based Resistive Random AccesPalabras claves:active region, Model, percolation, RERAM, resistive switching, Simulation, stochasticAutores:Laurent Raymond, Silvana Guitarra, Trojman L.Fuentes:googlescopusAssessment of STT-MRAM performance at nanoscaled technology nodes using a device-to-memory simulation framework
ArticleAbstract: This paper deals with the technology scalability of spin-transfer torque magnetic RAMs (STT-MRAMs)baPalabras claves:Device-to-memory analysis, FinFET, Magnetic tunnel junction (MTJ), STT-MRAM, technology scalingAutores:Crupi F., Esteban Garzón, Marco Lanuzza, Rose R.D., Trojman L.Fuentes:scopusAnalysis of the reset transition in bipolar HfO<inf>2</inf>-based ReRAM to improve modeling accuracy
Conference ObjectAbstract: A complete analysis of the two-step reset transition observed in the current-voltage curves of HfO2-Palabras claves:conductive filament, filamentary conduction, RERAM, reset, stochastic model, Switching, two-step transitionAutores:Laurent Raymond, Martin Gavilanez, Silvana Guitarra, Trojman L.Fuentes:googlescopusCapacitance Extraction of 34-nm Metallurgical Channel Length MOSFET for Parasitic Assessment Using the RFCV Technique
Conference ObjectAbstract: This paper presents the description and the results obtained with a new RFCV system written on pythoPalabras claves:Parameter Analyzer, PYTHON, RFCV, Source Measure Unit, Vector Network AnalyzerAutores:DIego R. Benalcázar, Esteban Garzón, Trojman L.Fuentes:scopusFrom 32 nm to TFET Technology: New Perspectives for Ultra-Scaled RF-DC Multiplier Circuits
ArticleAbstract: In this present work, different Cross-Coupled Differential Drive (CCDD) CMOS bridge rectifiers are dPalabras claves:32 nm, CCDD, Full wave rectifier, Multiplier, PCE, TFET, VCEAutores:Eduardo Ortiz-Holguin, Luis Miguel Procel Moya, Marco Villegas, Ramiro Taco, Trojman L.Fuentes:googlescopusHigh-Speed and Low-Energy Dual-Mode Logic based Single-Clack-Cycle Binary Comparator
Conference ObjectAbstract: This paper presents an energy-efficient single-clock-cycle binary Dual-Mode Logic (DML)-based comparPalabras claves:arithmetic circuits, binary comparator, CMOS, Dual-mode logicAutores:Luis Miguel Procel Moya, Marco Lanuzza, Ramiro Taco, Ricardo Escobar, Trojman L.Fuentes:scopus