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Proceedings of the 2016 IEEE ANDESCON, ANDESCON 2016(3)
IEEE Latin America Transactions(1)
IEEE Transactions on Device and Materials Reliability(1)
Remote control of VNA and parameter analyzer for RFCV measurements using Python
Conference ObjectAbstract: This paper presents the development of capacitance measurement with RF signal (RFCV) for MOSFET. SucPalabras claves:IEEE 488.2, MOSFET, Network Analyzer, PYTHON, RFCV, SCPI, SMU, VNAAutores:Esteban Garzón, Fernando Sanchez, Luis Miguel Procel Moya, Trojman L.Fuentes:scopusA Defect-Centric Analysis of the Temperature Dependence of the Channel Hot Carrier Degradation in nMOSFETs
ArticleAbstract: The defect-centric distribution is used to study the temperature dependence of channel hot carrier (Palabras claves:channel hot carrier degradation, defect-centric distribution, temperature analysisAutores:Crupi F., Franco J., Kaczer B., Luis Miguel Procel Moya, Trojman L.Fuentes:googlescopusTemperature study of defect generation, under channel hot carrier stress for 35-nm gate length MOSFETs using the Defect-Centric perspective
Conference ObjectAbstract: In this work, we present an analysis to separate the interface states generation from the oxide trapPalabras claves:channel hot carrier degradation, defect centrict framework, interface states, Oxide trapsAutores:Crupi F., Luis Miguel Procel Moya, Trojman L.Fuentes:googlescopusStatistical study of SiON short MOSFET under Channel Hot Carrier stress
Conference ObjectAbstract: In this work we study the threshold voltage variation (ΔVth) under a Channel Hot Carrier stress usinPalabras claves:channel hot carrier degradation, CMOS, defect generation SiON, mobility, short channel device, StatisticAutores:Juan S. Acosta, Luis Miguel Procel Moya, Mario Ortega, Trojman L.Fuentes:scopusStudy of the scaling and the temperature for RERAM cells using the QPC model
ArticleAbstract: This article describes the OXRAM cell operation for different areas and temperatures using the QuantPalabras claves:area scaling, HfO2, high-κ, QPC model, RERAM, TEMPERATURE, TinAutores:Laurent Raymond, Luis Miguel Procel Moya, Silvana Guitarra, Trojman L.Fuentes:googlescopus